La técnica de fotorreflectancia para analizar propiedades ópticas y mecánicas de muestras semiconductoras


Authors

  • Francy Nelly Jiménez G.
  • Carlos Vargas Hernández
  • Jesús Fabián Jurado

DOI:

https://doi.org/10.22517/23447214.3267

Abstract

Se presenta una revisión de la técnica de Fotorreflectancia (FR) desde su fundamentación teórica hasta algunas de sus aplicaciones. La fotorreflectancia es una técnica de modulación no destructiva que no requiere preparación previa de la muestra, es empleada ampliamente para el estudio de la estructura electrónica de semiconductores, con ella se pueden determinar las energías de los puntos críticos las cuales brindan información, entre otras de los esfuerzos presentes en las muestras.

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Published

2008-08-30

How to Cite

Jiménez G., F. N., Vargas Hernández, C., & Jurado, J. F. (2008). La técnica de fotorreflectancia para analizar propiedades ópticas y mecánicas de muestras semiconductoras. Scientia Et Technica, 2(39). https://doi.org/10.22517/23447214.3267

Issue

Vol. 2 No. 39 (2008)

Section

Ciencias Básicas

License

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